DualBeam Scanning Electron Microscope

FEI Helios Nanolab™ G3 DualBeam™ Focused Ion Beam-Scanning Electron Microscope

Helios

The FEI Helios Nanolab G3 DualBeam  FIB-SEM platform is designed to access a new world of extreme high resolution 2D and 3D characterization. Precise FIB slicing, combined with a high precision piezo stage and superb SEM performance support automated software for high-resolution sample surface montaging, unattended sample preparation, or 3D characterization. Serial slicing and imaging using the AutoSlice and View™ software creates a 3D-image stack with 4-nm isotropic resolution that may be reconstructed in separate software for high resolution visualization. Traditional SEM imaging allows high-resolution detail of sample surfaces of all types and materials to be quickly and easily elucidated.

Features

  • Ideal for the analysis of surface topographies or post-fixed resin-embedded samples by secondary or backscatter electron detection using the ETD, retractable CBS, and in-column TLD, MD, or ICD detectors.
  • The focused gallium-ion beam ablates fine slices as thin as 4-nm to reveal structure under the resin block surface in order to provide a novel 3D picture of the sample volume.
  • Maps™ software package allows large-format montaging over hundreds of micrometers, providing a “Google Street View”-like dataset.
  • Imaging data from any outside source may be imported and correlated in the Maps software for Correlative Light and Electron Microscopy (CLEM)
  • A retractable STEM detector allows low-voltage (10-30 keV) screening of TEM specimens.

Fast Facts

  • Isotropic 3D data acquisition
  • High Efficiency detectors for SE and BSE imaging
  • Precision 5-axes motorized stage
  • Better than 1.0 nm SEM resolution at all keVs
  • Better than 4.0 nm FIB resolution at 30 keV
  • Low kV FIB imaging down to 500 V

Location

  • Robertson Life Science Building P2

Visit the ThermoFisher website for more information on the Helios

Publications featuring Helios images

Monique Y. Rennie, Curran G. Gahan, Claudia S. López, Kent L. Thornburg and Sandra Rugonyi. 3D Imaging of the Early Embryonic Chicken Heart with Focused Ion Beam Scanning Electron Microscopy. Microscopy and Microanalysis. 2014 Aug; 20(4):1111-9. doi:10.1017/S1431927614000828.

ZEISS Crossbeam 550 Microscope with Cryo-stage and Atlas 5 Software

About the Crossbeam

The ZEISS Crossbeam 550 SEM combines high resolution, contrast, and signal-to-noise ratios of the GEMINI II column with the precise milling of the next-generation Ion-sculptor focused ion beam column.  The Atlas 5 software can be used for automatic 3D image acquisition using FIB milling of bulk samples or array tomography of serial sections on coverslips.  The microscope is additionally equipped with a cryo-stage that allows for imaging and automated TEM lamella preparation of frozen, vitrified samples.

Features

  • Isotropic 3D data acquisition
  • 6-axes motorized super-eucentric stage
  • Cryo capability using the Leica EM VCT500
  • Less than 2.0 nm SEM resolution at all keVs
  • 3 nm ion beam resolution

Visit the ZEISS web page describing the Crossbeam family

Location

  • Robertson Life Science Building P2

Fast facts

  • Ideal for surface topology of room temperature and frozen vitrified samples
  • Allows for 3D visualization of cell volume using focused ion beam milling or acquisition of serial section images
  • Performs TEM lamella preparation on frozen vitrified samples